rocm-systems/projects/rocshmem/tests/functional_tests/amo_extended_tester.hpp

/******************************************************************************
 * Copyright (c) Advanced Micro Devices, Inc. All rights reserved.
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 * SPDX-License-Identifier: MIT
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 * of this software and associated documentation files (the "Software"), to
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 * furnished to do so, subject to the following conditions:
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#ifndef _AMO_EXTENDED_TESTER_HPP_
#define _AMO_EXTENDED_TESTER_HPP_

#include "tester.hpp"

/******************************************************************************
 * HOST TESTER CLASS
 *****************************************************************************/
template <typename T>
class AMOExtendedTester : public Tester {
 public:
  explicit AMOExtendedTester(TesterArguments args);
  virtual ~AMOExtendedTester();

 protected:
  virtual void resetBuffers(size_t size) override;

  virtual void launchKernel(dim3 gridSize, dim3 blockSize, int loop,
                            size_t size) override;

  virtual void verifyResults(size_t size) override;

  void verifyDestValues();
  void verifyReturnValues();

  int  destIndex(int l, int elem_idx) const;
  int  numElems() const;
  std::pair<T*, int> retChunk(int l, int elem_idx) const;

  T*     dest{nullptr};        // symmetric target buffer [loop][elem]
  T*     ret_val{nullptr};     // device returns [loop][thread]

  size_t n_in{0};              // num_wgs * wg_size
  size_t n_out{0};             // elements per loop: PerBlock->num_wgs, PerGrid->1
  size_t n_loops{0};           // loop + skip
};

#endif