SWDEV-238517 - [dtest] Adding additional scenarios for block and grid dimension.
1. Corner case and negative test scenarios added for block and grid dimension.
Change-Id: I094faf02570fec101f688462712934b94ceb37e1
[ROCm/hip commit: b1d78e4096]
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@@ -1,5 +1,5 @@
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/*
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Copyright (c) 2019 - present Advanced Micro Devices, Inc. All rights reserved.
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Copyright (c) 2021 - present Advanced Micro Devices, Inc. All rights reserved.
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Permission is hereby granted, free of charge, to any person obtaining a copy
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of this software and associated documentation files (the "Software"), to deal
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in the Software without restriction, including without limitation the rights
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@@ -79,3 +79,5 @@ extern "C" __global__ void FourSecKernel(int clockrate) {
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}
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}
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extern "C" __global__ void dummyKernel() {
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}
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