SWDEV-238517 - [dtest] Adding additional scenarios for block and grid dimension.

1. Corner case and negative test scenarios added for block and grid dimension.

Change-Id: I094faf02570fec101f688462712934b94ceb37e1


[ROCm/hip commit: b1d78e4096]
This commit is contained in:
Rupam Chetia
2021-03-12 17:09:04 +05:30
parent db7803ee5d
commit c1f57da073
3 changed files with 444 additions and 9 deletions
@@ -1,5 +1,5 @@
/*
Copyright (c) 2019 - present Advanced Micro Devices, Inc. All rights reserved.
Copyright (c) 2021 - present Advanced Micro Devices, Inc. All rights reserved.
Permission is hereby granted, free of charge, to any person obtaining a copy
of this software and associated documentation files (the "Software"), to deal
in the Software without restriction, including without limitation the rights
@@ -79,3 +79,5 @@ extern "C" __global__ void FourSecKernel(int clockrate) {
}
}
extern "C" __global__ void dummyKernel() {
}