EXSWHTEC-286 - Implement tests for log device math functions #230

Change-Id: I642a9d865fcc30d7b303b0d4dd05fcd723a59015


[ROCm/hip-tests commit: 95a75cf00f]
This commit is contained in:
Nives Vukovic
2024-01-22 23:46:23 +05:30
committed by Rakesh Roy
parent 8f9f3e61d2
commit ccfb8b3ff5
8 changed files with 409 additions and 1 deletions
@@ -131,6 +131,9 @@
"=== Patch which removes the typetraits implementation from std namespace in hiprtc is reverted ===",
"Unit_hiprtc_stdheaders",
"Unit_hipGraphAddMemcpyNode_Negative_Parameters",
"=== Below 2 tests are disable due to defect EXSWHTEC-369 ===",
"Unit_Device_ilogbf_Accuracy_Positive",
"Unit_Device_ilogb_Accuracy_Positive",
"Unit_hipMemAddressFree_negative",
"Unit_hipMemAddressReserve_AlignmentTest",
"Unit_hipMemAddressReserve_Negative",
@@ -222,6 +222,9 @@
"NOTE: The following test is disabled due to defect - EXSWHTEC-244",
"Unit_hipExtLaunchMultiKernelMultiDevice_Negative_Parameters",
"Unit_hipMemAddressFree_negative",
"=== Below 2 tests are disable due to defect EXSWHTEC-369 ===",
"Unit_Device_ilogbf_Accuracy_Positive",
"Unit_Device_ilogb_Accuracy_Positive",
"Unit_hipMemAddressReserve_AlignmentTest",
"Unit_hipGraphAddMemcpyNode_Negative_Parameters",
"Unit_hipMemCreate_ChkWithKerLaunch",