nives-vukovic fcdbcd743a EXSWHTEC-65 - Implement additional Initialization and Version tests (#2972)
- Separate hipRuntimeGetVersion and hipDeviceGetUuid tests into positive and negative tests
 - Split Unit_hipDeviceGetUuid into Unit_hipDeviceGetUuid_Positive and Unit_hipDeviceGetUuid_Negative
 - Split Unit_hipRuntimeGetVersion_NegAndValTst into Unit_hipRuntimeGetVersion_Positive and Unit_hipRuntimeGetVersion_Negative
- Modify tests to use hipDevice_t instead of integer for devices in hipDeviceGetUuid negative test
- Implement additional Initialization and Version tests
 - Expand hipDeviceComputeCapability negative test with case when device is invalid
 - Expand hipDeviceGetP2PAttribute negative test with case when src and dst devices are the same
 - Expand hipDeviceGetP2PAttribute negative test with case when device is out of bound
 - Modify hipDeviceTotalMem negative test with case when device is invalid
 - Implement Unit_hipDeviceGetPCIBusId_PartialFill test which validates partial filling the bus id into a char array
- Fix minor formatting issues and change hipDeviceGetPCIBusId partial fill test into negative
- Modify negative tests to use integer device values
- Disable hipDeviceGetPCIBusId negative test on AMD

[ROCm/hip-tests commit: d7fafa8696]
2022-11-04 19:29:26 +05:30
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